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In electronics manufacturing, every failed test demands attention. But what happens when that failure isn't actually a product defect?

False failures—often referred to as "false rejects" or "No Trouble Found (NTF)" events—are one of the most expensive and overlooked challenges in production...

You fix your #1 failure mode. Yield goes up. Everyone's happy for a month.

Then the next Pareto report comes in, and there's a new #1 — something that barely registered before. It looks like a new problem appeared out of nowhere. Engineering calls it whack-a-mole. It isn't. It's math.

As electronic products become more complex, manufacturers are under constant pressure to improve quality while controlling production costs. One of the most common questions engineering teams face is whether they should invest in In-Circuit Test (ICT), Functional Test (FCT), or both.

At NI Connect, Circuit Check’s Joel Avrunin presented a growing challenge facing manufacturers worldwide: how to securely connect legacy and untrusted test systems without exposing production environments to unnecessary cybersecurity risk.

In today’s fast-moving manufacturing environments, test systems are more than just equipment—they are a critical link between product design and production output. When a system goes down or underperforms, the impact is immediate: lost uptime, delayed schedules, increased costs, and added pressure...