How to Reduce Test Time Without Sacrificing Quality
In today’s manufacturing environment, every second on the production floor matters. As product volumes increase and production schedules become tighter, manufacturers are continually looking for ways to reduce test time and increase throughput.
But faster testing should never come at the expense of...
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From Prototype to Mission: Tackling the Testing and Validation Challenges of Modern Space Systems
The space industry is moving faster than ever.
From lunar and multi-planetary exploration to growing satellite constellations, commercial space stations, advanced payloads and increasingly sophisticated ground systems, today’s space programs are being asked to accomplish more—and do it on...
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The Hidden Cost of False Failures in Manufacturing
In electronics manufacturing, every failed test demands attention. But what happens when that failure isn't actually a product defect?
False failures—often referred to as "false rejects" or "No Trouble Found (NTF)" events—are one of the most expensive and overlooked challenges in production...
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Your Pareto Chart Isn't Wrong — It's Censored
You fix your #1 failure mode. Yield goes up. Everyone's happy for a month.
Then the next Pareto report comes in, and there's a new #1 — something that barely registered before. It looks like a new problem appeared out of nowhere. Engineering calls it whack-a-mole. It isn't. It's math.
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In-Circuit Test (ICT) vs. Functional Test: Why the Best Manufacturing Test Strategy Often Uses Both
As electronic products become more complex, manufacturers are under constant pressure to improve quality while controlling production costs. One of the most common questions engineering teams face is whether they should invest in In-Circuit Test (ICT), Functional Test (FCT), or both.
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